The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2002
Filed:
Mar. 11, 1999
Applicant:
Inventors:
Tony S. El-Kik, Lehigh, PA (US);
Jeffrey P. Grundvig, Macungie, PA (US);
Assignee:
Agere Systems Guardian Corp., Orlando, FL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/100 ;
U.S. Cl.
CPC ...
G06F 1/100 ;
Abstract
The use of a JTAG port for boundary scan testing of integrated circuits, (IC) thereby allowing for the testing of the IC's after they have been mounted onto a circuit board. The present invention speeds the testing of integrated circuitry by introducing an external memory where all the test vectors are stored. This external memory is connected to the digital processor core by a high speed interface extended memory interface (EMI). The test vectors are uploaded into the digital processor core from the external memory via the high speed EMI interface.