The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2002
Filed:
Apr. 02, 1999
Applicant:
Inventor:
Robert Bishop, Newton, MA (US);
Assignee:
Beltronics, Inc., Newton, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ; G06K 9/56 ; G06K 9/42 ; H04N 7/18 ;
U.S. Cl.
CPC ...
G06K 9/00 ; G06K 9/56 ; G06K 9/42 ; H04N 7/18 ;
Abstract
A novel wafer or circuit board automatic scanning optical inspection system and technique using the reference comparison principle for finding defects in scanned sample images, that enables a new degree of universality in finding all defects including very small single pixel conductor breaks and shorts and defects of irregular shapes, and together with simultaneous design rule processing, through the use of processed skeletal reference images and with separately programmable alignment tolerance and detection parameters.