The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2002
Filed:
Apr. 05, 2001
Yosihiro Yamada, Kyoto, JP;
Yoshihiro Ueno, Kusatsu, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
In an image processing, a high-absorber area is set and weighting is carried out according to a length of a path through which X-rays pass in the high-absorber area, so that estimated image taking data at a portion where X-rays pass through the high-absorber area in considering a weight is obtained. Measured projection data at the portion where X-rays pass through the high-absorber area is replaced by data according to overwriting estimated projection data obtained by forward projecting the estimated image to correct and reconstitute the measured projection data. Thus, there can be obtained a corrected fault image having a reduced artifact and a high contrast, and considering the weight in the high-absorber area. Therefore, the artifact formed on the fault image due to absorption or dispersion of X-rays by an X-ray high-absorber, such as metal, can be reduced.