The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2002

Filed:

Sep. 17, 1999
Applicant:
Inventors:

Lin Yang, Fremont, CA (US);

Yan Zhong, San Jose, CA (US);

Kevin Hwang, Cupertino, CA (US);

Assignee:

Cadonca Design Systems, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03D 1/00 ;
U.S. Cl.
CPC ...
H03D 1/00 ;
Abstract

Method and system for efficiently and quickly forming a sequence of convolution values from an over-sampled digital signal sequence. Convolution value differences are computable from a set of digital signal values that is smaller than the original set of signal values by a factor of R, the over-sampling rate. The number of adders and the associated time delay for computation of the convolution differences are reduced by at least a factor R and by at least a factor approximately proportional to log (R), respectively, as compared to conventional computation of a convolution value. This approach is used to estimate a time value for which the convolution attains a largest magnitude or value.


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