The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2002

Filed:

May. 20, 1999
Applicant:
Inventors:

James M. Knittel, Groton, MA (US);

Drew R. Martin, Medford, MA (US);

Hanspeter Pfister, Somerville, MA (US);

Urs H. Kanus, Tuebingen, DE;

Assignee:

Terarecon, Inc., San Mateo, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 1/700 ;
U.S. Cl.
CPC ...
G06T 1/700 ;
Abstract

Reflection intensities of volume samples of a volume are mapped in a rendering pipeline by determining a reflection vector from a gradient vector associated with a sample and an eye vector associated with the volume. A diffuse reflectance map is indexed by the gradient vector to obtain a diffuse intensity. A specular reflection map is indexed by the gradient vector to obtain a specular intensity in response to a bypass signal being true, and a specular reflection map is indexed by the reflection vector to obtain the specular intensity in response to the bypass signal being false.


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