The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2002

Filed:

Oct. 07, 1999
Applicant:
Inventors:

Ying-Tsung Lu, Kaohsiung, TW;

Jeng-Feng Lin, Yunlin Hsien, TW;

Pong Lai, Taipei Hsien, TW;

Pai-Ping Huang, Hsinchu Hsien, TW;

Wann-Diing Tyan, Chiayi, TW;

Hoang-Yan Lin, Keelung, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B42D 1/500 ;
U.S. Cl.
CPC ...
B42D 1/500 ;
Abstract

A diffractive anti-counterfeiting tag structure with capabilities of naked-eye inspection and machine inspection and its method of manufacture. The anti-counterfeiting tag structure has a naked-eye inspection component and a machine inspection non-grating diffractive component. The naked-eye inspection component and the non-grating diffractive component are formed on separate mold-boards and then joined together to form a mold-board using a board-joining technique. Alternatively, a plurality of naked-eye inspection blocks and a plurality of non-grating diffractive blocks are randomly mixed together to form a pixel-like diffractive anti-counterfeiting tag.


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Lu, Ying-Tsung. (2002). Diffractive anti-counterfeiting tag with naked-eye inspection and machine inspection (U.S. Patent No. 6425606). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6425606

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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