The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2002

Filed:

Jun. 29, 1999
Applicant:
Inventors:

Francis Xavier Rojas, Austin, TX (US);

Keiichi Yamamoto, Austin, TX (US);

Elizabeth Carol Meade, Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/45 ;
U.S. Cl.
CPC ...
G06F 9/45 ;
Abstract

A mock translation system, method and program is provided which converts single-byte base-language data and performs a mock translation on it to produce internationalization test data which takes the form of the corresponding base-language data transliterated into and displayed using a double-byte character set to create double-wide characters. The double-wide characters take into account the spacing, i.e., field length, needed to perform an actual translation. This data is stored in localization files and displayed in a software application in place of the English or foreign-language text. By visually inspecting each screen, the programmer or proofreader is able to easily recognize many internationalization errors, without requiring the ability to read any foreign languages. These errors include truncation, alignment, or other formatting errors, and programming errors such as text that is hard-coded, localization files missing from the program build, and text missing from localization files.


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