The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2002
Filed:
Sep. 20, 1999
Applicant:
Inventor:
Nicholas W. Dawes, Ottawa, CA;
Assignee:
Loran Network Management Ltd., Bridgetown, BB;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/500 ;
U.S. Cl.
CPC ...
G06F 1/500 ;
Abstract
A method of detecting outliers measured during progression of an activity of an entity from one point to another point, comprising measuring activity at a point in a first dimension, measuring the same activity at the same point in at least a second dimension referenced to the same time as measuring the activity in the first dimension, and rejecting outliers which have values outside a maximum expected difference between the activity measured in the first and second dimensions.