The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2002
Filed:
Feb. 19, 1999
Keiji Tsukada, Kashiwa, JP;
Akihiko Kandori, Hachioji, JP;
Tsuyoshi Miyashita, Kokubunji, JP;
Hiroyuki Suzuki, Hitachinaka, JP;
Hitoshi Sasabuchi, Mito, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A magnetic field measurement apparatus includes a plurality of magnetometers one comprising SQUID's and three detection coils each of which detects each of three orthogonal directional magnetic field components (B , B , B ) of a magnetic field generated from a subject to be inspected, a display which displays time variation of waveforms of the magnitude {{square root over ( )}(B +B +B )} of a magnetic field synthesized by square sum of each of the three orthogonal directional magnetic field components of the magnetic field generated from the subject to be inspected, a holding means for holding a Dewar's vessel for arranging magnetometers therein, and a controlling means for controlling a positional relationship between the subject to be inspected and the Dewar's vessel. Accurate time variation of the magnetic field generated from the subject to be inspected can be detected without influence of positional change of the subject to be inspected, by simultaneously measuring each of the three orthogonal directional magnetic field components (B , B , B ) of the magnetic field generated from current sources in the subject to be inspected.