The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2002

Filed:

Oct. 25, 1999
Applicant:
Inventors:

Erich R. Gross, Rohnert Park, CA (US);

Anthony S. Lee, Petaluma, CA (US);

Assignee:

Textron Systems Corporation, Wilmington, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/02 ; G01J 3/42 ;
U.S. Cl.
CPC ...
G01J 3/02 ; G01J 3/42 ;
Abstract

Percentage concentrations of constituents or color components of a sample are determined using a spectral analyzer with a wide illumination spot size and detector. The analyzer irradiates the sample, picks up diffuse reflectance of individual wavelengths from the sample and spatially separates the diffuse reflectance into a response at individual wavelengths. The result is to simultaneously detect the intensities of the individual wavelengths in parallel from the sample being analyzed. Percentage constituents of a composite substance can be determined or, alternatively, the components of color in a sample can be determined by analyzing wavelengths of reflected light.


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