The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2002
Filed:
Jun. 12, 1998
William L. Weber, Wallkill, NY (US);
Harold R. Van Aken, Wallkill, NY (US);
Perry A. Palumbo, Gardiner, NY (US);
Joseph Corrado, Marlboro, NY (US);
GretagMacbeth LLC, New Windsor, NY (US);
Abstract
An integrating sphere, and an integrating sphere-based reflectance colorimeter/spectrophotometer for the measurement of color and appearance, having multiple receivers capable of concurrently receiving optical radiation scattered/reflected from a diffusely illuminated sample surface, with the capability of multiple measurement modes (e.g., multiple specular component excluded (SCE), SCE and specular component included (SCI), multiple SCI), multiple areas-of-view for a given measurement mode, multiple viewing angles per measurement mode, and combinations thereof. An embodiment of the invention includes two SCI receivers and two SCE receivers, each disposed at an equal viewing angle relative to the sample surface. For each viewing mode, two sample areas-of-view are provided. The SCE receivers are opposite each other, such that the specular component of each SCE receiver is excluded by the port of the other SCE receiver. The receivers provide the collected light reflected from the sample to a detector which preferably is provided by multiple spectrometers or a single spectrometer having multichannel capability to preferably sense the light from each receiver in parallel.