The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2002

Filed:

Apr. 24, 2001
Applicant:
Inventors:

Armin W. Doerry, Albuquerque, NM (US);

Douglas L. Bickel, Albuquerque, NM (US);

Assignee:

Sandia Corporation, Albuquerque, NM (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 1/300 ;
U.S. Cl.
CPC ...
G01S 1/300 ;
Abstract

IFSAR images of a target scene are generated by compensating for variations in vertical separation between collection surfaces defined for each IFSAR antenna by adjusting the baseline projection during image generation. In addition, height information from all antennas is processed before processing range and azimuth information in a normal fashion to create the IFSAR image.


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