The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2002

Filed:

Aug. 07, 1998
Applicant:
Inventors:

Richard Aufrichtig, Wauwatosa, WI (US);

Gary F. Relihan, Nashotah, WI (US);

Clarence L. Gordon, III, Waukesha, WI (US);

Baoming Ma, Latham, NY (US);

Assignee:

General Electric Company, Waukesha, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 1/800 ;
U.S. Cl.
CPC ...
G01D 1/800 ;
Abstract

A neural network prediction has been provided for predicting radiation exposure and/or Air-Kerma at a predefined arbitrary distance during an x-ray exposure; and for predicting radiation exposure and/or Air-Kerma area product for a radiographic x-ray exposure. The Air-Kerma levels are predicted directly from the x-ray exposure parameters. The method or model is provided to predict the radiation exposure or Air-Kerma for an arbitrary radiographic x-ray exposure by providing input variables to identify the spectral characteristics of the x-ray beam, providing a neural net which has been trained to calculate the exposure or Air-Kerma value, and by scaling the neural net output by the calibrated tube efficiency, and the actual current through the x-ray tube and the duration of the exposure. The prediction for exposure/Air-Kerma further applies the actual source-to-object distance, and the prediction for exposure/Air-Kerma area product further applies the actual imaged field area at a source-to-image distance.


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