The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2002
Filed:
Jul. 13, 2000
Vincent S. Polkus, Delafield, WI (US);
Alexander Ganin, Whitefish Bay, WI (US);
Jon C. Omernick, Wauwatosa, WI (US);
Ping Xue, Cottage Grove, WI (US);
General Electric Company, Waukesha, WI (US);
Abstract
In an X-ray imaging system, an arrangement is provided for readily aligning the system detector with the X-ray beam field, i.e., the projection of the X-ray beam into the plane of the detector. The arrangement is adapted for correcting or compensating for distortion which results from X-ray beam angulation, wherein the beam is projected toward the detector plane at an angle of less than 90°. Initially, the system X-ray tube is positioned to project the X-ray beam at a given beam direction angle &phgr;. A beam width angle &ggr; is then computed, from the given angle &phgr; and from specified values of the source-to-image distance and the length of the projected beam field. Thereupon, an offset value is determined from &ggr; , &phgr; and the source-to-image distance to locate the geometric center of the beam field, and the center of the detector is aligned therewith.