The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2002
Filed:
Apr. 04, 2000
Hugo S. Ferguson, Tarpon Springs, FL (US);
Dynamic Systems Inc., Poestenkill, NY (US);
Abstract
Thermodynamic material testing apparatus and a method for use therein which are capable of controllably inducing very large strains in crystalline metallic specimens. The apparatus prevents longitudinal flow elongation, that otherwise results in conventional testing systems when a specimen is compressively deformed, from occurring but permits sideways material flow outwards from a specimen work zone. The specimen is rotated between successive deformations through a predefined angle, e.g., 90 degrees, in order to present strained specimen material to opposing anvil faces for a next successive compressive deformation. Rotating the specimen between hits and hence compressing previously strained material permits the same work zone material to be deformed many times with very high strains induced therein.