The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2002
Filed:
Mar. 23, 1999
Applicant:
Inventors:
Beat Emch, Eglisau, CH;
Rolf Joss, Horgen, CH;
Felix Brunner, Wetzikon, CH;
Bernhard Hitlebrand, Uster, CH;
Peter Schilling, Siebnen, CH;
Beat Keller, Dübendorf, CH;
Hanspeter Wepfer, Unterstammheim, CH;
Assignee:
Zellweger Luwa AG, Uster, CH;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 5/04 ;
U.S. Cl.
CPC ...
G01L 5/04 ;
Abstract
The invention relates to a device for measuring properties of a longitudinally moved test material in a measuring cell. In order to provide a device which is easier to adapt to the requirements of a customer and to the special conditions of a production machine for longitudinally moved test material, the measuring cell ( ) is connected to a processor ( ), which is associated exclusively with the measuring cell.