The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2002
Filed:
Jul. 22, 1999
Leland Lester, Austin, TX (US);
David Iglehart, Austin, TX (US);
Stephen J. Swain, Austin, TX (US);
Marco Becker, Oeding, DE;
Charles W. Race, Jr., Austin, TX (US);
Michael D. Perrine, Austin, TX (US);
Siemens Information and Communication Mobile, LLC, San Diego, CA (US);
Abstract
A system and method are disclosed for automated testing of electronic devices. An original test is performed on a model product ( ) while the model product ( ) is coupled to a test recorder ( ). During the test, the model product ( ) is manipulated to invoke a desired response. As the test is performed, the manipulations and the desired responses are recorded by the test recorder ( ) in an executable format ( ). Subsequently, a test analyzer ( ) is coupled to a to-be-tested product ( ), and the executable recording ( ) of the test is played such that the to-be-tested product ( ) is manipulated as the model product ( ) had been manipulated during the original test. The to-be-tested product's ( ) responses to the manipulations are compared against the model product's responses ( ). Any difference between the to-be-tested product's ( ) responses and the model product's ( ) responses are identified.