The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2002
Filed:
Apr. 10, 2000
On-line system for quantitative analysis of multi-component additives and coatings in sheet material
Metso Paper Automation Oy, , FI;
Abstract
The present invention is a method and apparatus for calculating the amount and composition of inorganic material in a sheet material. The apparatus of the present invention is capable of calculating the composition of all the additives at once without requiring multiple cycles. The apparatus uses a combination of two techniques, namely an X-ray fluorescence analysis and a preferential X-ray absorption analysis. X-ray fluorescence is measured by a thermoelectrically cooled solid state detector. The apparatus can measure more than three additives. Measurement of argon in the air is used for compensation of electronic drift. An empirical correction is used to compensate for mutual interaction between X-ray fluorescence radiation and clay or talc. The measurement is compensated for dust accumulation by fluorescing the dust.