The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2002

Filed:

Sep. 02, 1999
Applicant:
Inventors:

Toshio Kanai, Moriyama, JP;

Teruhiko Ushio, Moriyama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 ;
U.S. Cl.
CPC ...
G11B 7/00 ;
Abstract

A maximum mark length detector comprising a total value register for storing a total value Lsum of measured mark lengths; a measured value register for storing a measured value of a mark length; an arithmetic unit for computing the sum Lp of a current measured value Lk and a previously measured value PLk stored in the measured value register and subtracting a maximum value Lmax from the total value Lsum when the total value Lsum reaches the measured maximum value Lmax; a counter to count the number of times the subtraction is performed; and a comparator for completing the detection when a count value C of the counter reaches a predetermined value.


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Kanai, Toshio. (2002). Apparatus and method for detecting maximum mark lengths (U.S. Patent No. 6421309). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6421309

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