The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2002
Filed:
Jan. 26, 1999
Robert Yuan-Shih Li, Fremont, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and apparatus for compensating for multiple thermal asperity events in a sector. The present invention provides for the detection, recording and recovery from errors caused by multiple thermal asperities occurring in a single sector. The method includes detecting thermal asperity events in a sector, setting a flag indicating each occurrence of a thermal asperity event in the sector, maintaining a count of the detected thermal asperity events in the sector and recording a byte location for each of the detected thermal asperity events in the sector. The method further includes performing a data recovery procedure in response to the detected thermal asperity events. The data recovery procedure is performed using the flag settings and a location corresponding to the detected thermal asperity events. The data recovery procedure is performed using the count of the detected thermal asperity events. The setting of a flag includes setting a bit in a register. The setting of a bit indicates a start byte location for a thermal asperity event. The maintaining a count of the detected thermal asperity events in the sector includes the setting of a bit in the register for each detected thermal asperity event, the count being equal to a number of bits set in the register. The recording a location for each of the detected thermal asperity events in the sector includes setting a bit in a register, the bit position being associated with the location of the asperity event. The maintaining a count of the detected thermal asperity events in the sector includes setting a bit in a register for each detected thermal asperity events, the count being equal to a number of bits set in the register.