The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6421129 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 16, 2002

Filed:

Mar. 30, 2001
Applicant:
Inventor:

Tuyoshi Ishikawa, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/155 ; G01N 2/147 ;
U.S. Cl.
CPC ...
G01N 2/155 ; G01N 2/147 ;
Abstract

A pattern reading apparatus includes an objective lens positioned opposite an object surface, the object surface being a reflection surface having a pattern formed thereon as an object to be read. A minute-area light source is positioned to be conjugate with a center of curvature of the object surface through the objective lens, for illuminating the object surface through the objective lens. An imaging lens is positioned farther from the object surface than the light source, with the optical axis of the imaging lens being coincident with the objective lens. An imaging element reads the image of the pattern which is reflected at the object surface and formed through the objective lens and the imaging lens.


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