The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2002

Filed:

Jan. 13, 1998
Applicant:
Inventors:

Allen N. Garroway, Davidsonville, MD (US);

Joel B. Miller, Cheverly, MD (US);

Bryan H. Suits, Boughton, MI (US);

Richard L. Garwin, Scarsdale, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

An apparatus which includes a probe for detecting a resonance signal induced in a sample. The probe and the resonance signal each have a respective, corresponding Q, and the ratio, Q′, of the Q of the probe to the Q of the resonance signal is relatively large. Preferably, Q′ is greater than, or equal to, 1.


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Garroway, Allen. (2002). Probe for detecting a transient magnetic resonance signal, wherein the ratio of the q of the probe to the q of the resonance signal is relatively large (U.S. Patent No. 6420872). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6420872

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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