The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2002
Filed:
Jul. 14, 2000
Edward Alois Reitman, Gotha, FL (US);
Lucent Technologies Inc., Murray Hill, NJ (US);
Abstract
A system and method for identifying events in a manufacturing process from a sequence of m-dimensional input data signals, m≧2 obtained from monitoring of the manufacturing process utilizing a data processor for transforming each m-dimensional input data signal to a set of output data signals based on an orthogonal polynomial transform function, wherein the input data signals are used as coefficients in evaluating the polynomial transform functions. The data processor also integrates the transform function within the defined limits of the transform function to determine a scalar value as a function of time. A display system may be used to display a graph of the scalar values as a function of time for visually identifying events or the processor may identify events based on detected scalar values. The transform function may be Fourier, Chebyshev, Legendre or other polynomial type function.