The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2002
Filed:
Aug. 02, 1999
Winfried Peter, Hohenems, AT;
Thomas Hensler, Klaus, AT;
Omicron Electronics GmbH, Altach, AT;
Abstract
Test system and test method for testing the operability of test samples ( ). A selection can be made in a user-specific manner from a plurality of test modules ( ) which are made available, which can be assembled together to a desired test specification. A control module ( ) carries out the overall test corresponding to the user-specific test specification, and controls individual selected test modules ( ) in the desired sequence in correspondence to this test specification. Advantageously, there is produced automatically a test report on the test results of the individual selected test modules ( ), which reports in particular embedded in the user-specific test specification.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile