The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2002
Filed:
Dec. 06, 1999
Applicant:
Inventors:
Ho Wai Wong-Lam, Los Altos, CA (US);
Mark Douglas Naley, Santa Clara, CA (US);
Assignee:
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/300 ;
U.S. Cl.
CPC ...
G01R 1/300 ;
Abstract
The present invention is directed to systems and methods for analyzing high and low values in a period waveform in a manner that is applicable and accurate for both pulse-shaped waveforms and non-pulse-shaped waveforms. In an example implementation, a processor is adapted to generate a waveform histogram of the signal with weighted data samples, and to determine from the waveform histogram the high and low values in the waveform. Other aspects of the invention involve various manners in obtaining the weighted data samples.