The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2002
Filed:
Mar. 28, 2000
Robert Bloor, Pearland, TX (US);
Uwe Albertin, Houston, TX (US);
WesternGeco, L.L.C., Houston, TX (US);
Abstract
This invention provides a method for analyzing and compensating for the deleterious effects of irregular illumination of the subsurface due to velocity variations in the subsurface and of irregular spatial sampling of seismic data. For a processing operator, like Kirchoff migration for seismic data, a conventional migration operation is carried out. The output points are analyzed for sampling artifacts caused by irregular surface sampling of the data and those due to ray path distortions. An inverse sampling operator or a filtering operator is determined that is related to dip dependent attributes at the image location. Application of the inverse sampling operator or filtering operator along with the migration or other processing operator to the seismic data compensates for the effects of irregular sampling and of raypath distortion.