The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2002

Filed:

Jan. 02, 2001
Applicant:
Inventors:

Wayne Kwok-Wai Wong, Camarillo, CA (US);

Saul Rodriguez, Port Hueneme, CA (US);

Assignee:

Harris Corporation, Melbourne, FL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04M 1/00 ;
U.S. Cl.
CPC ...
H04M 1/00 ;
Abstract

A telephone test set is protected from an excessive current condition by a protection circuit that maintains sufficient loop current flow for continuous operation of the telephone equipment's functional circuitry, while by-passing and/or reducing excess current that could potentially damage the protected circuitry. A series current-limiting element is installed in the loop current path between a tip and ring interface and the circuitry of the telephone test set. A current shunting circuit is installed across the tip-ring ports of the protected circuit downstream of the current-limiting element. A current sense circuit monitors the loop current and controls the operation of the shunting circuit in accordance with the magnitude of the loop current. If a substantial overcurrent condition persists for an extended period of time, the resulting power dissipation associated with the high current flow will cause the current limiting element to change to a high impedance state. Once the overcurrent condition terminates, the series element will revert to its low impedance state.


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