The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2002
Filed:
Oct. 20, 1999
Applicant:
Inventors:
Yong Cheol Park, Kyonggi-do, KR;
Myong Gu Lee, Kyonggi-do, KR;
Jong In Shin, Kyonggi-do, KR;
Kyu Hwa Jeong, Kyonggi-do, KR;
Sung Dae Kim, Kyonggi-do, KR;
Assignee:
LG Electronics Inc., Seoul, KR;
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/09 ;
U.S. Cl.
CPC ...
G11B 5/09 ;
Abstract
Method for formatting, and managing a defective area of, a rewritable optical recording medium when a secondary defect list (SDL) is converted into a primary defect list (PDL) without certification by converting only sector numbers of first sectors of the defective blocks listed on the SDL into the PDL. If the defective sector thus listed of the PDL is encountered during writing/reading thereafter, a block (=16 sectors) containing the defective sector is subjected to slipping replacement.