The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2002
Filed:
Jun. 11, 2001
Keith S. Champlin, Minneapolis, MN (US);
Other;
Abstract
The disclosed invention relates to measuring an ac dynamic parameter (e.g., impedance, admittance, resistance, reactance, conductance, susceptance) of an electrochemical cell/battery or other electrical element under conditions of possible interference from potential sources such as ac magnetic fields and/or ac currents at the powerline frequency and its harmonics. More generally, it relates to evaluating a signal component at a known frequency f under conditions of possible hum, noise, or other spurious interference at one or more other known frequencies. A microprocessor or microcontroller commands A/D circuitry to sample a band-limited signal at M evenly spaced times per period 1/f distributed over an integer number N of such periods and calculates time-averaged Fourier coefficients from these samples. The frequency response of the calculated Fourier coefficients displays perfect nulls at evenly spaced frequencies either side of frequency f . By choosing N according to algorithms disclosed herein, null responses are made to coincide with the one or more frequencies of potential hum, noise, or other spurious interference.