The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2002
Filed:
Feb. 03, 2000
Seok Kil Han, Taejon, KR;
Kwang Yong Kang, Taejon, KR;
Sang Dong Jung, Taejon, KR;
Herold R. Fettemam, Los Angeles, CA (US);
Abstract
A near-field optical heterodyne measurement system for measuring characteristic of high-frequency and high-speed devices includes a combining unit for combining two optical beams to produce a submicron-size optical beam, wherein the two optical beams have different frequency from each other, a near-field fiber-optic probe for injecting the submicron-size optical beam into a sample device to be measured, a position controlling unit for controlling a position of the near-field fiber-optic probe, and a measuring unit for receiving a millimeter wave exited from the sample device to measure characteristics of the sample device.