The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2002

Filed:

Sep. 10, 1999
Applicant:
Inventor:

Hidechika Hayashi, Kanagawa, JP;

Assignee:

Tosoh Corporation, Shinnanyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/100 ;
U.S. Cl.
CPC ...
G01N 3/100 ;
Abstract

A chromatogram analyzer is provided which analyzes a chromatogram obtained by applying a sample containing an analyte. The chromatogram analyzer can be used after peak detection, for example, based on predicted peak emergence times for respective analytes of interest and can determine proper baselines even in the presence of peaks attributable to components other than the analytes or ghost peaks. The chromatogram analyzer is used for an analysis of a chromatogram developed by chromatography, namely by separating and detecting analytes in a sample. Although chromatography is divided into various types of liquid chromatography and gas chromatography according to the principles for separation and development, a chromatogram obtained by any type of chromatography can be analyzed. For example, an electrophoretically obtained result stained with a proper dye can be analyzed by using the present invention after photometric scanning.


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