The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2002

Filed:

Feb. 12, 1993
Applicant:
Inventors:

Chisato Kato, Toyota, JP;

Takahiro Kobayashi, Toyota, JP;

Kazuo Kitao, Toyota, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/900 ;
U.S. Cl.
CPC ...
G06F 1/900 ;
Abstract

A feedback compensating apparatus for adjusting the working condition of a working machine of a working system adapted to process working portions of successive workpieces under control of a machine controller, which determines the working condition from an extraneous signal. The apparatus is used with the controller and a measuring device for measuring the dimensions of the processed working portions of the workpieces, and includes a device for obtaining dimensional data based on outputs of the measuring device during and/or after a working operation of the machine on each workpiece. The dimensional data include a dimensional error of the processed working portions, and a variable indicative of a tendency of change in the dimensional error. The apparatus further includes a device for determining the extraneous signal based on the dimensional data, and applying the signal to the machine controller to adjust the working condition of the machine. Also disclosed is a method of processing workpieces using the apparatus.


Find Patent Forward Citations

Kato, Chisato. (2002). Apparatus and method for feedback-adjusting working condition for improving dimensional accuracy of processed workpieces (U.S. Patent No. 6415200). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6415200

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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