The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2002

Filed:

Jan. 21, 2000
Applicant:
Inventors:

Yves Painchaud, Sillery, CA;

Stéphane Chatigny, Quebec, CA;

Michel Morin, Cap-Rouge, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 ;
U.S. Cl.
CPC ...
A61B 5/00 ;
Abstract

The method for scanning a turbid medium involves displacing an optical signal source over a first face of the medium and a corresponding optical detector over an opposite face from one respective spatial location to another. Each spatial location is associated with a corresponding input region on the first face and a corresponding output region on the opposite second face. The optical detector in response to optical signals detected from each of the output regions generates a primary set of image data, secondary and/or tertiary image data by scanning the turbid medium using input regions and output regions of different sizes. The various sets of image data obtained may be manipulated in any manner, namely subjected to a data processing technique, so as to, for example, highlight the differences or similarities between the images.


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