The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2002

Filed:

May. 10, 1999
Applicant:
Inventors:

Scott D. Quigley, Townville, SC (US);

Sue Henderson, Greenville, SC (US);

Assignee:

Wagner Systems Corporation, Greenville, SC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

This invention defines a system and method of generating and reporting a fabric analysis to a customer. Information is generated from various tests performed on the fabric. The information gathered from the tests is then digitized in a computer readable format. The digitized information is compiled into an electronic form. The information organized in the electronic form is the fabric analysis report which is delivered to the customer. The amount of time in which this report allows information to be distributed to the customer is greatly reduced and allow providing an additional advantage over the traditional means of reporting.


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