The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2002
Filed:
Dec. 29, 1998
Applicant:
Inventors:
Roger S. Simpson, Northville, MI (US);
Donald K. Cohen, Farmington Hills, MI (US);
Assignee:
Advanced Material Processing, Wayne, MI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract
A nondestructive method and apparatus for the inspection of impact treated surfaces to predict impact treatment process variables which acquires a multi-dimensional map of an impact treated surface, characterizes the multi-dimensional map to develop surface texture parameters, and develops relationships between the surface texture parameters and the impact treatment process variables.