The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2002
Filed:
May. 04, 1995
Takashi Kaneko, Kanagawa-ken, JP;
Masato Some, Kanagawa-ken, JP;
Fuji Photo Film Co., Ltd., Kanagawa-Ken, JP;
Abstract
An image analyzing apparatus for forming images on a CRT based on image data and effecting quantitative analysis includes an image density lower limit setting section for setting a lower limit value of image density, an image density upper limit setting section for setting an upper limit value of image density and an image area specifying section for specifying image areas having density equal to or higher than the lower limit value of image density set by the image density lower limit setting means and equal to or lower than the upper limit value of image density set by the image density upper limit setting means from among the images displayed on the CRT. According to the thus constituted image analyzing apparatus, it is possible to specify a desired image area and quantitatively analyze the image area.