The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2002

Filed:

Dec. 21, 2000
Applicant:
Inventors:

Francois Nicolas, Palaiseau, FR;

Jean Lienard, Clamart, FR;

Serge Muller, Guyancourt, FR;

Elisabeth Soubelet, Meudon, FR;

Andreas Rick, Plaisir, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/304 ;
U.S. Cl.
CPC ...
G01N 2/304 ;
Abstract

Method and system for compensating for the thickness of an organ in a radiology instrument, in which an image of the radiological thicknesses of the organ through which the X-ray beam has passed is calculated on the basis of a digitized image, the thickness image is filtered using a low-pass filter in order to obtain a low-frequency image, the low-frequency image is subtracted from the radiological thickness image in order to obtain a contrast image, the low-frequency image is processed using a pre-recorded table taking into account a contract &khgr; selected by a user in order to obtain an image with reduced dynamic range, and the image with reduced dynamic range is added to the contrast image in order to obtain a compensated thickness image, the pixels having a level below or above a predetermined threshold being returned at least to the value of the threshold, while preserving the differences and real ratios between the anatomical structures.


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