The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2002
Filed:
Dec. 13, 2000
Norbert Gaul, Solms-Oberbiel, DE;
Leica Microsystems Wetzlar GmbH, Wetzlar, DE;
Abstract
The invention relates to an analyzer insert ( ) in which the rotation of an adjustment wheel ( ) accessible from the outside is transmitted by means of two parallel adjustment levers ( ) of equal length onto a rotatable analyzer ( ) which can be inserted into the optical path of the microscope. The one ends ( ) of the adjustment levers ( ) are rotationally mounted at the level of the adjustment wheel ( ) on bearing axles ( ) near the rim while the other ends ( ) are mounted on the axles at the level of the analyzer holder ( ). At the level of the adjustment wheel ( ) and the analyzer holder ( ), in relation to the axes of rotation ( ) of same these axles generate force levers of equal length, which are situated pairwise at a 90° angle to each other. In the 0° position of the analyzer ( ) all four bearing axles ( ) are situated on a straight line. The analyzer ( ) can be moved into any position between 0° and 180° precisely and without slip. An extremely flat analyzer insert ( ) is obtained when the adjustment levers ( ) consist of thin sheets and engage slits ( ) inside the analyzer holder. This new analyzer insert ( ) is easier and more economical to produce than known analyzer inserts with drive belts or toothed wheels.