The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2002
Filed:
Jun. 02, 2000
Tracy L. Sayre, Fort Collins, CO (US);
Robert A. Slutz, Loveland, CO (US);
Kris J. Kanack, Loveland, CO (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A test fixture for electrically connecting a plurality of limited-access test targets on a loaded circuit board with a plurality of interface probes of a tester may comprise a plurality of elongate test probes, a universal interface plate (UIP), and a wireless interface printed circuit board (WIPCB). A first end of each elongate test probe is substantially aligned with a limited-access target on the loaded circuit board when the test fixture is positioned adjacent the loaded circuit board. Each of a plurality of double-headed spring probes mounted to the UIP has a first spring loaded head located at its first end and a second spring loaded head located at its second end. Each double-headed spring probe is generally axially aligned with an elongate test probe so that its first spring loaded head contacts a second end of the corresponding elongate test probe. Each of a plurality of contact pads on the first side of the WIPCB is substantially aligned with a double-headed spring probe so that each contact pad contacts the second spring loaded head of the corresponding double-headed spring probe. Each of a plurality of contact targets on the second side of the WIPCB is electrically connected to a contact pad on the first side of the WIPCB and contacts an interface probe of the tester when the test fixture is mounted on the tester.