The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2002

Filed:

Nov. 22, 2000
Applicant:
Inventors:

Christopher K. Anand, Chesterland, OH (US);

James A. Halamek, Independence, OH (US);

C. Michael Steckner, Richmond Heights, OH (US);

Assignee:

Philips Medical Systems (Cleveland), Inc., Highland Heights, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

A three-dimensional fast spin echo (FSE) scan is performed by stepping ( ) through a plurality of phase encode k-space views from a computed view list ( ). The view list is computed such that (i) magnetic resonance echoes having a selected image contrast are encoded in the center of k-space, (ii) adjacent data lines in k-space have similar contrast, and (iii) common planes of data lines in k-space are completed at regular intervals. As each data line is read, it is Fourier transformed ( ) and stored ( ) within a fast-access memory ( ). Once a plane of data lines is acquired, it is Fourier transformed ( ) along a second direction using a plurality of parallel processors ( ). The twice-transformed data is stored ( ) in conventional memory ( ). Once all of the phase encode views on the view list are acquired, a final Fourier transform ( ) along a third direction is performed ( ), rendering a volumetric image representation. The method of data acquisition uses fewer memory buffers and takes less time than conventional methods.


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