The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2002

Filed:

Jul. 14, 1999
Applicant:
Inventor:

Kenneth C-H Nai, Edinburgh, GB;

Assignee:

Renishaw, PLC, Gloucestershire, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 2/100 ; G01B 2/100 ; B23Q 1/720 ;
U.S. Cl.
CPC ...
G01P 2/100 ; G01B 2/100 ; B23Q 1/720 ;
Abstract

A coordinate measuring machine (CMM) carries a probe and is controlled by a controller to drive the probe to take measurements on a workpiece. In order to reduce the effects of acceleration-induced deflections of the probe on the measurements made by the machine, accelerometers are provided to measure the accelerations of the probe and to produce signals indicative thereof. The acceleration signals ( ) are passed to the controller (FIG. ) where they are integrated ( ) and filtered ( ) before being passed as velocity signals ( ) to a summing junction ( ) from which they are fed to a velocity feedback control loop ( ) which reduces any changes in the velocity (and hence deflection) of the probe due to the accelerations.


Find Patent Forward Citations

Nai, Kenneth C-H. (2002). Method of and apparatus for reducing vibrations on probes carried by coordinate measuring machines (U.S. Patent No. 6412329). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6412329

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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