The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2002

Filed:

May. 06, 1999
Applicant:
Inventor:

Li-Wen Chen, Cupertino, CA (US);

Assignee:

MetaEdge Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/760 ;
U.S. Cl.
CPC ...
G06F 1/760 ;
Abstract

According to the invention, techniques for organizing information from systems in a data warehousing environment are provided. In a particular embodiment, the invention provides an apparatus for analyzing data in at least data source of an enterprise. The apparatus can include a meta model for an enterprise. The enterprise is typically a business activity, but can also be other loci of human activity. A data schema derived from the meta model can also be part of the apparatus. The apparatus can also include a database organized according to the data schema. The apparatus can translate data from a variety of sources to the data schema. The apparatus can incorporate data into the database and perform a variety of analyses on the data in the database.


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