The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2002
Filed:
Jun. 29, 1999
Applicant:
Inventors:
Taiwei Lu, Petaluma, CA (US);
Robert A. Lieberman, Torrance, CA (US);
Emile Fiesler, Torrance, CA (US);
Allan Wang, Torrance, CA (US);
Assignee:
Intelligent Optical Systems, Inc., Torrance, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 1/502 ;
U.S. Cl.
CPC ...
G01B 1/502 ;
Abstract
Systems and methods using a spectrometer system for real-time automatic evaluation of tissue injury are described. A method of assessing an injury to tissue comprises reflecting an electromagnetic signal from the tissue to produce a reflected electromagnetic signal; producing spectral data pertaining to the intensities of individual wavelengths of the reflected electromagnetic signal; analyzing the spectral data to obtain a set of results; and providing an indication of the nature of the injury to the tissue based upon the set of results.