The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2002
Filed:
Feb. 02, 1999
Shih-Chin Chen, Dublin, OH (US);
ABB Industrial Systems, Inc., Columbus, OH (US);
Abstract
Multiple two-dimensional variation patterns are extracted from two-dimensional sheet measurement data of sheet material being manufactured with the variation patterns being classified to identify the causes of the extracted patterns. The extracted two-dimensional variation patterns are identified with the elements or components of the process or machine which caused the patterns. The machine components which cause the variation patterns can then be adjusted and/or controlled so that the patterns can be reduced or substantially eliminated in sheets of material produced by the machine. In addition to adjustment and/or control of the process or machine producing the sheet of material, the extracted variation patterns can be used as new representations of sheet quality, process or machine quality and the patterns will provide more in-depth understanding for operators of the machine.