The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2002

Filed:

Dec. 08, 1998
Applicant:
Inventors:

Young-jung Yun, Suwon, KR;

Jong-ho Ha, Kyonggi-do, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/04 ;
U.S. Cl.
CPC ...
H04N 1/04 ;
Abstract

A method for correcting scanning errors in a shuttle type of a scanner, including the steps of scanning a pattern sheet on which pattern data having a specified shape are recorded. Errors for decline of the pattern data are corrected by using the pattern data having a straight line among the scanned pattern data having the specified shape. Then, errors for distance between bands are corrected by using the pattern data having the specified shape among the pattern data of which the errors for decline are corrected. Accordingly, since the errors for decline and the errors for distance between the bands can be corrected by using a computing program, there is an advantage in that correcting the errors of the pattern data is very simple. A further advantage is in that even if the scanner is subjected to an impact from its exterior, correcting the errors for decline and the errors for distance between the bands can be promptly performed.


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Yun, Young-jung. (2002). Method and apparatus for correcting scanning errors in a shuttle type scanner (U.S. Patent No. 6411405). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6411405

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