The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2002

Filed:

Mar. 24, 1999
Applicant:
Inventors:

Taichi Yanagiya, Tokyo, JP;

Tomohiro Kimura, Tokyo, JP;

Ikuro Ueno, Tokyo, JP;

Masayuki Yoshida, Tokyo, JP;

Fumitaka Ono, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 7/00 ;
U.S. Cl.
CPC ...
H03M 7/00 ;
Abstract

In an adaptive probability estimation method, an index referring to coding parameters is determined according to occurrence probabilities of symbols from estimated occurrence counts of symbols, thresholds for probability values that determine the probability intervals corresponding to the indexes are set to values that are examined with small operational load, and an index referring to the corresponding occurrence probability is selected without division, using the probability intervals determined by the thresholds for probability values.


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