The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2002
Filed:
Feb. 18, 2000
Kurt Feichtinger, Palling, DE;
Dr. Johannes Heidenhain GmbH, Traunreut, DE;
Abstract
An angle measuring system for high-precision determination of the angular position of an object, the system including a stationary component unit, a rotationally symmetrical measurement graduation that is connected to an object that rotates about an axis of rotation (R) and a plurality of scanner units that are disposed in a defined three-dimensional orientation in the stationary component unit and serve to scan the measurement graduation at a plurality of different measurement graduation sites and generate angular-position-dependent fractional scanning signals. The system includes a correction system that receives the fractional scanning signals of the scanner units and generates angle-dependent output signals that are freed of errors that result from a possibly occurring nonagreement of the axis of rotation (R) of the object with an axis of symmetry of the measurement graduation.