The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2002

Filed:

Oct. 02, 2000
Applicant:
Inventors:

Douglas C. Hittle, Fort Collins, CO (US);

Tifani L. André, Kentfield, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 1/00 ; G01K 1/300 ;
U.S. Cl.
CPC ...
G01K 1/00 ; G01K 1/300 ;
Abstract

An apparatus and method for evaluation of a material having a first and second contact-surface. The apparatus includes a computer-controlled thermally-variable central element comprising a first and second outer surface, at least one outer surface having at least one temperature sensor thereon. Facing the first outer surface is a first exterior surface of a first thermally-variable side element, and facing the second outer surface is a second exterior surface of a second thermally-variable side element. A mechanism is a second exterior surface of a second thermally-variable side element. A mechanism is included that operates to move at least the first exterior surface toward the thermally-variable central element to apply a generally uniform pressure against the material contact-surfaces once the material has been so positioned.


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