The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2002
Filed:
Aug. 10, 1999
Applicant:
Inventors:
Jay W. Grate, West Richland, WA (US);
Barry M. Wise, Manson, WA (US);
Assignee:
Battelle Memorial Institute, Richland, WA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/900 ;
U.S. Cl.
CPC ...
G01N 2/900 ;
Abstract
Disclosed is a method for taking the data generated from an array of responses from a multichannel instrument, and determining the characteristics of a chemical in the sample without the necessity of calibrating or training the instrument with known samples containing the same chemical. The characteristics determined by the method are then used to classify and identify the chemical in the sample. The method can also be used to quantify the concentration of the chemical in the sample.