The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2002

Filed:

Dec. 27, 1999
Applicant:
Inventors:

Hui Hu, Waukesha, WI (US);

Jiang Hsieh, Waukesha, WI (US);

Stanley H. Fox, Brookfield, WI (US);

Kishore C. Acharya, Brookfield, WI (US);

Hui David He, Waukesha, WI (US);

Yi Sun, Waukesha, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 ;
U.S. Cl.
CPC ...
A61B 6/00 ;
Abstract

A method for generating an image of an object using a computed tomography (CT) imaging system, which includes at least one x-ray detector array and at least one rotating x-ray source projecting an x-ray beam, includes the steps of identifying a physiological cycle of the object (the cycle comprising a plurality of phases); selecting at least one phase of the object; collecting at least one segment of projection data for each selected phase of the object during each rotation of each x-ray source; generating a projection data set by combining the projection data segments; generating a cross-sectional image of the entire object from the projection data set; and communicating the image or data associated with the image to a remote facility. The remote facility provides remote services over a network.


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